Si5020-EVB
Functional Description
The evaluation board simplifies characterization of the
Si5020 Clock and Data Recovery (CDR) device by
providing access to all of the Si5020 I/Os. Device
performance can be evaluated by following the Test
Configuration section below. Specific performance
metrics include jitter tolerance, jitter generation, and
jitter transfer.
Power Supply
The evaluation board requires one 2.5 V supply. Supply
filtering is placed on the board to filter typical system
noise components, however, initial performance testing
should use a linear supply capable of supplying 2.5 V
±5% dc.
CAUTION : The evaluation board is designed so that the
body of the SMA jacks and GND are shorted. Care must
be taken when powering the PCB at potentials other
than GND at 0.0 V and VDD at 2.5 V relative to chassis
GND.
Self-Calibration
The Si5020 device provides an internal self-calibration
To improve the DATAOUT eye-diagram, short 100 ?
transmission line segments precede the 50 ? high-
speed traces. These segments increase the interface
bandwidth from the chip to the 50 ? traces and reduce
data inter-symbol-interference. Please refer to Silicon
Laboratories application note AN43 for more details.
Note: The 50 ? termination is for each terminal/side of a dif-
ferential signal, thus the differential termination is actu-
ally 50 ? + 50 ? = 100 ? .
REFCLK
REFCLK is used to center the frequency of the
DSPLL? so that the device can lock to the data. Ideally
the REFCLK frequency should be 1/128th, 1/32nd, or
1/16th the VCO frequency and must have a frequency
accuracy of ±100 PPM. Internally, the CDR
automatically recognizes the REFCLK frequency within
one of these three frequency ranges. Typical REFCLK
frequencies are given in Table 1. REFCLK is AC
coupled to the SMA jacks located on the top side of the
evaluation board.
Table 1. Typical REFCLK Frequencies
function that optimizes the loop gain parameters within
the internal DSPLL TM . Self-calibration is initiated by a
high-to-low transition of the PWRDN/CAL signal while a
valid reference clock is supplied to the REFCLK input.
On the Si5020-EVB board, a voltage detector IC is
utilized to initiate self-calibration. The voltage detector
drives the PWRDN/CAL signal low after the supply
voltage has reached a specific voltage level. This circuit
is described in Silicon Laboratories application note
SONET/SDH
19.44 MHz
77.76 MHz
155.52 MHz
Gigabit
Ethernet
19.53 MHz
78.125 MHz
156.25 MHz
SONET/
SDH with
15/14 FEC
20.83 MHz
83.31 MHz
166.63 MHz
Ratio of
VCO to
REFCLK
128
32
16
AN42. On the Si5020-EVB, the PWRDN/CAL signal is
also accessible via a jumper located in the lower left-
hand corner of the evaluation board. PWRDN/CAL is
wired to the signal post adjacent to the 2.5 V post.
Device Powerdown
The CDR can be powered down via the PWRDN/CAL
signal. When asserted the evaluation board will draw
minimal current. PWRDN/CAL is controlled via one
jumper located in the lower left-hand corner of the
evaluation board. PWRDN/CAL is wired to the signal
post adjacent to the 2.5 V post.
CLKOUT, DATAOUT, DATAIN
These high-speed I/Os are wired to the board perimeter
on 30 mil (0.030 inch) 50 ? microstrip lines to the end-
launch SMA jacks as labeled on the PCB. These I/Os
are AC coupled to simplify direct connection to a wide
array of standard test hardware. Because each of these
signals are differential both the positive (+) and negative
(–) terminals must be terminated to 50 ? . Terminating
only one side will adversely degrade the performance of
the CDR. The inputs are terminated on the die with 50 ?
resistors.
RATESEL
RATESEL is used to configure the CDR to recover clock
and data at different data rates. RATESEL is a two bit
binary input that is controlled via two jumpers located in
the lower left-hand corner of the evaluation board.
RATESEL0/1 are wired to the center posts (signal post)
between 2.5 V and GND. For example, the OC-48 data
rate is selected by jumping RATESEL0 to 0.0 V and
RATESEL1 to 0.0 V.
The table given on the evaluation board lists
approximate data rates for the jumper configurations
shown in Figure 1. Applications with data rates within
±7% of the given data rate are also accommodated.
2
Rev. 1.0
相关PDF资料
SI5023-EVB BOARD EVALUATION FOR SI5023
SI5110-EVB BOARD EVALUATION FOR SI5110
SI5320-EVB BOARD EVALUATION FOR SI5320
SI5321-EVB BOARD EVALUATION FOR SI5321
SI5364-EVB BOARD EVALUATION FOR SI5364
SI5XX-PROG-EVB KIT EVALUATION FOR SI5XX
SI84XXCOM-RD KIT EVAL FOR SI84XXCOM
SILICON-EXPLORER II SOFTWARE ANALYSIS EXPLORER LOGIC
相关代理商/技术参数
SI-50210-F 功能描述:CONN MAGJACK 1PT 10/100BTX G/Y RoHS:是 类别:连接器,互连式 >> 模块 - 带磁性元件的插座 系列:MagJack® ST SI-50000 标准包装:63 系列:Mag45 连接器类型:RJ45 端口数:1 行数:1 安装类型:面板安装,通孔,直角 速度:10/100 Base-T 板上方高度:0.555"(14.10mm) LED 颜色:绿 - 绿 每一插座芯体的数目:5 屏蔽:屏蔽 翼片方向:上 特点:板锁 包装:托盘
SI-50211-F 功能描述:CONN MAGJACK 1PT 10/100BTX G/G RoHS:是 类别:连接器,互连式 >> 模块 - 带磁性元件的插座 系列:MagJack® ST SI-50000 标准包装:63 系列:Mag45 连接器类型:RJ45 端口数:1 行数:1 安装类型:面板安装,通孔,直角 速度:10/100 Base-T 板上方高度:0.555"(14.10mm) LED 颜色:绿 - 绿 每一插座芯体的数目:5 屏蔽:屏蔽 翼片方向:上 特点:板锁 包装:托盘
SI-50212-F 功能描述:CONN MAGJACK 1PT 10/100BTX Y/G RoHS:是 类别:连接器,互连式 >> 模块 - 带磁性元件的插座 系列:MagJack® ST SI-50000 标准包装:63 系列:Mag45 连接器类型:RJ45 端口数:1 行数:1 安装类型:面板安装,通孔,直角 速度:10/100 Base-T 板上方高度:0.555"(14.10mm) LED 颜色:绿 - 绿 每一插座芯体的数目:5 屏蔽:屏蔽 翼片方向:上 特点:板锁 包装:托盘
SI-50213 制造商:BEL 制造商全称:Bel Fuse Inc. 功能描述:SI-50213
SI-50214-F 功能描述:CONN MAGJACK 1PT 10/100BTX GO/Y RoHS:是 类别:连接器,互连式 >> 模块 - 带磁性元件的插座 系列:MagJack® ST SI-50000 标准包装:63 系列:Mag45 连接器类型:RJ45 端口数:1 行数:1 安装类型:面板安装,通孔,直角 速度:10/100 Base-T 板上方高度:0.555"(14.10mm) LED 颜色:绿 - 绿 每一插座芯体的数目:5 屏蔽:屏蔽 翼片方向:上 特点:板锁 包装:托盘
SI-50215 制造商:BEL 制造商全称:Bel Fuse Inc. 功能描述:SI-50215
SI-50215-F 制造商:BEL 制造商全称:Bel Fuse Inc. 功能描述:SI-50215-F
SI-50216-F 制造商:BEL 制造商全称:Bel Fuse Inc. 功能描述:SI-50216-F